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11/05/2012 | Press release
distributed by noodls on 11/06/2012 03:48
FOR IMMEDIATE RELEASE
Carl Buck Marilynn Meek
V.P. of Marketing Analyst/Investor Contact
(510) 623-9400 x381 (212) 827-3773
William Wymbs
CEO
(408) 230-9711
Fremont, CA (November 5, 2012) - Aehr Test Systems (Nasdaq:
AEHR), a worldwide supplier of semiconductor test and burn-in
equipment, and AllianceATE Consulting Group (AllianceATE), a
semiconductor software and test services company, announced a
partnership today to add Alliance ATE's VelocityCAE software
as an option to Aehr Test's ABTSTM advanced
burn-in and test systems.
VelocityCAE is a test program, vector and timing generation
tool suite developed by AllianceATE. VelocityCAE takes EDA
Simulation design files and translates them into complete
test programs for use on Aehr Test's ABTS system.
"Our partnership with Aehr combines the design-to-test
capabilities of VelocityCAE with Aehr Test's burn-in
technology to help meet the evolving needs of semiconductor
companies," said Bill Wymbs, CEO at AllianceATE. "We believe
that our expertise in both test program and vector
translation complements Aehr's state-of-the-art capabilities
in the burn-in and test market."
Test engineers typically use industry-standard WGL (Waveform
Generation Language) and STIL (Standard Test Interface
Language) vector formats to run tests on semiconductor
devices during both product characterization and production
test. To increase test coverage and reduce time-to-market,
semiconductor companies are now using these same vector
formats during the burn-in process. VelocityCAE software from
AllianceATE will convert WGL and STIL vectors to run on Aehr
Test's ABTS test and burn-in systems, making test program
development more efficient and decreasing time-to-market.
"Semiconductor companies are asking for more functional test
capabilities both during the burn- in stage with our ABTS
system and in wafer sort with our FOX TM
full-wafer test system," said Carl Buck, vice president of
marketing at Aehr Test Systems. "We are excited to be able to
partner with AllianceATE to provide our customers with a
better way to generate both test
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vectors and test programs so that they have a faster time to
market. These capabilities are increasingly important, as the
latest ABTS system has a full functional test sequencer
backed by
32 million vectors to exercise the devices under test."
Aehr Test will also offer an advanced version of VelocityCAE
to their customers, which includes full automated test
program generation from product engineering spreadsheets,
which will decrease time-to-market further.
The ABTS family of products is based on a new hardware and
software architecture that is designed to address not only
today's devices, but also future devices for many years to
come. It can test and burn-in both logic and memory devices,
including resources for high pin-count devices and
configurations for high-power and low-power applications. The
ABTS system can be configured with up to 72 burn-in boards
with up to 320 I/O channels each and 32M of test vector
memory per channel. The ABTS system is optimized for use with
the Sensata iSocket* Thermal Management Technology, which
provides a scalable cost-effective solution using individual
device temperature control for ICs up to 75 watts or more.
Individual temperature control enables high-power devices
with a broad range of power dissipation to be burned-in
simultaneously in a single burn-in chamber while maintaining
a precise device temperature. The ABTS system also uses N+1
redundancy technology for many key components in the system
to maximize system uptime.
*iSocket is a trademark of Sensata Technologies, Inc.
Headquartered in Fremont, California, Aehr Test Systems is a
worldwide provider of test systems for burning-in and testing
logic and memory integrated circuits and has an installed
base
of more than 2,500 systems worldwide. Increased quality and
reliability needs of the Automotive
and Mobility integrated
circuit markets are driving additional test requirements,
capacity needs and opportunities for Aehr Test products in
package and wafer level test. Aehr Test has developed and
introduced several innovative products, including the ABTS
and FOX families of test and burn-in systems and the DiePak®
carrier. The ABTS system is used in production and
qualification testing of packaged parts for both low-power
and high-power logic as well as all common types of memory
devices. The FOX system is a full wafer contact test and
burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers and
systems-on-a-chip. The DiePak carrier is a reusable,
temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of bare die. For more
information, please visit the Company's website at www.aehr.com.
Based in the heart of Silicon Valley, AllianceATE Consulting
Group, Inc is a semiconductor software and test services
company that automates the design-to-test processes. Alliance
ATE can deliver turnkey production test solutions targeted at
a variety of test platforms and contract
manufacturers.
VelocityCAE software was developed by AllianceATE to reduce
time-to-market of complex semiconductor device test solutions
while reducing test development cost by orders of magnitude.
For more information visit www.allianceate.com.
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This release contains forward-looking statements that involve
risks and uncertainties relating to projections regarding
customer demand and acceptance of Aehr Test's products.
Actual results may vary from projected results. These risks
and uncertainties include, without limitation, acceptance by
customers of the ABTS technology, acceptance by customers of
the ABTS systems shipped upon receipt of a purchase order and
the ability of new products to meet customer needs or perform
as described. See Aehr Test's recent 10-K, 10-Q and other
reports from time to time filed with the Securities and
Exchange Commission for a more detailed description of the
risks facing our business. The Company disclaims any
obligation to update information contained in any
forward-looking statement to reflect events or circumstances
occurring after the date of this press release.
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